A. Firiti : rechercher sur Z-Library

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1

Impact of semiconductors material on IR Laser Stimulation signal

A. Firiti, F. Beaudoin, G. Haller, P. Perdu, D. Lewis, P. Fouillat

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 760 KB

english, 2005

2

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing

F. Beaudoin, R. Desplats, P. Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis

Journal:

Microelectronics Reliability

Année:

2003

Fichier:

PDF, 1.36 MB

2003

3

A new method to quantify retention-failed cells of an EEPROM CAST

C. Le Roux, L. Lopez, A. Firiti, J.L. Ogier, F. Lalande, R. Laffont, G. Micolau

Journal:

Microelectronics Reliability

Année:

2007

Langue:

english

Fichier:

PDF, 848 KB

english, 2007

4

Short defect characterization based on TCR parameter extraction

A. Firiti, D. Faujour, G. Haller, J.M. Moragues, V. Goubier, P. Perdu, F. Beaudoin, D. Lewis

Journal:

Microelectronics Reliability

Année:

2003

Fichier:

PDF, 1.60 MB

2003

5

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs

Sienkiewicz, M., Perdu, P., Firiti, A., Sanchez, K., Crepel, O., Lewis, D.

Journal:

Microelectronics Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 496 KB

english, 2008

6

[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Thermal laser stimulation effects on NMOS transistor

Firiti, A., Haller, G., Lewis, D., Fouillat, P., Perdu, P., Beaudoin, F.

Année:

2004

Langue:

english

Fichier:

PDF, 239 KB

english, 2004

7

[IEEE IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (7-11 July 2003)] Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003 - Implementing Thermal Laser and Photoelectric Laser Stimulation in a failure analysis laboratory

Firiti, A., Lewis, D., Beaudoin, F., Perdu, P., Haller, G., Danto, Y.

Année:

2003

Langue:

english

Fichier:

PDF, 270 KB

english, 2003

8

An experimental method allowing quantifying and localizing failed cells of an EEPROM CAST after a retention test

C. Le Roux, L. Lopez, A. Firiti, J.L. Ogier, F. Lalande, R. Laffont, G. Micolau

Journal:

Solid-State Electronics

Année:

2008

Langue:

english

Fichier:

PDF, 510 KB

english, 2008

9

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Methodology to support laser-localized soft defects on analog and mixed-mode advanced ICs

Sienkiewcz, Magdalena, Firiti, Abdellatif, Crepel, Olivier, Perdu, Philippe, Sanchez, Kevin, Lewis, Dean

Année:

2009

Langue:

english

Fichier:

PDF, 454 KB

english, 2009

10

[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Failure analysis enhancement by evaluating the Thermal Laser Stimulation impact on analog ICs

Sienkiewicz, Magdalena, Perdu, Philippe, Firiti, Abdellatif, Crepel, Olivier, Lewis, Dean

Année:

2008

Langue:

english

Fichier:

PDF, 437 KB

english, 2008

11

[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - An experimental method allowing quantifying and localizing failed cells of an EEPROM CAST after a retention test.

Le Roux, C., Lopez, L., Firiti, A., Ogier, J.L., Lalande, F., Laffont, R., Micolau, G.

Année:

2007

Langue:

english

Fichier:

PDF, 225 KB

english, 2007

12

[IEEE 2004 IEEE International Symposium on Industrial Electronics - Ajaccio, France (2005.05.7-2005.05.7)] 2004 IEEE International Symposium on Industrial Electronics - Photoelectric laser stimulation in a failure analysis laboratory

Firiti, A., Lewis, D., Beaudoin, F., Perdu, P., Haller, G., Fouillat, P.

Année:

2004

Langue:

english

Fichier:

PDF, 3.20 MB

english, 2004

13

[IEEE 2016 IEEE 18th Electronics Packaging Technology Conference (EPTC) - Singapore, Singapore (2016.11.30-2016.12.3)] 2016 IEEE 18th Electronics Packaging Technology Conference (EPTC) - Bromine induces corrosion in reliability test

Lee, Ni Hsing, Yu, Cheng Fu, O'Halloran, Orla, Firiti, Abdellatif, Acar, Zemre, Cannesan, Nicolas, Hao, Yuan Wen, Chen, Jyun Ji, Tsai, Johan, Sun, Peter, Chen, Sharon

Année:

2016

Fichier:

PDF, 454 KB

2016